| No | System ID (Adı) info: yalcin.kalkan@ibu.edu.tr or senolkaya@ibu.edu.tr | Photo (Görsel) | 
| 1 | 
			 Plasma Enhanced Atomic Layer Deposition- ALD (In Clean Room) (Plazma Arttırımlı Atomik Düzeyde Katman Kaplama) -Reactant: DI-water, Ozone -Precursor: Given by consumer  | 
			
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| 2 | 
			 DC/RF Sputtering (In Clean Room) (DC/RF Saçtırma Sistemi) - 4 inch target materials are used - Substrate heater up to 150 degree - Up to 8 inch wafer process (unifomity >89% ) - RF power up to 350 Watt 
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| 3 | 
			 Electron Beam and Thermal Evaporator (Combine System) (In Clean Room) (Birleşik Elektron Demeti ve Termal Buharlaştırma Sistemi) - Various oxide and metal deposition - Target materials given by consumer - Up to 8 inch wafer process (unifomity >95% ) - Substrate heater up to 230 degree 
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| 4 | 
			 Thermal Evaporator (In Clean Room) (Termal Buharlaştırma Sistemi) - Metal evaporation only - Target materials given by consumer 
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| 5 | 
			 Wet/Dry Oxidation Furnace (In Clean Room) (Islak/Kuru Oksidasyon Fırını) -High Quality SiO2 deposition up to 1100 degree - 25 pieces wafer capability for 6 inch wafers 
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| 6 | 
			 Boron/Phosphorus Thermal Doping Furnace (In Clean Room) (Termal Boron/Fosfor Katkılama Fırını) - Proces capability up to 1100 degree - 25 pieces wafer capability for 6 inch wafers 
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| 7 | 
			 Programmable Annealing Furnace (In Clean Room) (Programlanabilir Tavlama Fırını) - Up to 1100 degree under O2, N2H2, N2 enviroment 
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| 8 | 
			 Rapid Thermal Annealing-RTA (In Clean Room) (Hızlı Tavlama Fırını) - Ramp up rate up to 30 degree/second -8 inch wafers process up to 950 degree - Temperature unifomity > 95% - N2 and O2 inert enviroment 
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| 9 | 
			 Mask Aligner (In Clean Room) (Maske Hizalama Sistemi) -Up to 8 icnh wafer -Compability for photolitography - Aling process capability up to 2 micron channel length and width  | 
			
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| 10 | 
			 Spic Coater (In Clean Room) (Spin Kaplama Cilazı) -6 inch and 8 inch process capability - Rotation up to 8000 rpm 
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| 11 | 
			 Wet Benches (3 different) (In Clean Room) (Islak Tezgahlar 3 adet) -Semi-auto process capability -Connected with 18 Mohm DI-water and 6N dry N2 
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| 12 | 
			 Four Point Probe Resistivity Measurement (In Clean Room) (Dört Nokta Prob Direnç Ölçer) - Semi-Auto system combined with Keithley units - Surface uniformity map can be studied  | 
			
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| 13 | 
			 PN Checker (In Clean Room) (PN Tip Ölçer) -Controlling the types of semicondutors (P or N type conductivity) 
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| 14 | 
			 Spectroscopic Reflectometer (In Clean Room) (Spektroskopik Reflektometre) - Thickness of deposited layer speficication- 10 nm or higher -Reflection measurements can be performed 
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| 15 | 
			 Probe Station with Keithley 4200 SCS (Keithley 4200 SCS ile Bütünleşik Prob İstasyonu) - I-V, C-V, CP measurement - Current limits to 10 pA for MOSFETs -Fast Capacitance Meas. - Measurements capability from -50 to 150 degree 
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| 16 | 
			 Keithley 2636B Sourcemeter -Test Fixture connected - Dual Channel connection -Perform Quick I-V characterization - 100mV to 40V voltage, 100nA to 10A current range  | 
			
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| 17 | 
			 Dicing Saw (Alttaş Kesme Sistemi) -Compable for Si wafers - Cutting precision 2-3 micrometer 
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| 18 | 
			 Wire Bonder (Tel Bağlama Sistemi) -Al wire are used -Semi-auto process 
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| 19 | 
			 Solar Simulator (Solar simülatörü) -Efficiency specificationf of Cells - I-V measurements under solar spec (Von, Isc etc.) 
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| 20 | 
			 Lamination System (Laminasyon Sistemi) -Fabrication of Solar Panel - Up to 60 pieces of Cell laminations - Glass to glass or Glass to backsheet panel fabrication 
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| 21 | 
			 Some Other Tools - Oscilloscope (Tektronix ) - Ph/resistivity meters of liquids - DI-water (18 M-ohm) purification - N2 purification system 
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